Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Making computer chips smaller is not just about better design. It also depends on a critical step in manufacturing called patterning, where nanoscale structures are carved into materials to form the ...

The ‘Tapping Mode SQUID-on-Tip’ (TM-SOT) microscope enables multimodal imaging to be performed extremely close to the sample surface using tapping mode feedback. This allows for stability during ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters. Researchers at Rice University have shown ...

Yield loss is increasingly driven by molecular variability in thin films, interfaces, and contamination rather than visible defects. Reliability issues often appear first as parametric drift or margin ...

Making computer chips smaller is not just about better design. It also depends on a critical step in manufacturing called patterning, where nanoscale ...

Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique ...

Researchers in the United States have developed a new technique that can spot hidden ...

For the first time ever, scientists have uncovered a vast field of tektites in Brazil — mysterious glassy fragments forged when a powerful extraterrestrial object slammed into Earth about 6.3 million ...