Abstract: In modern Very-Large-Scale Integration (VLSI) technology, managing information loss is a critical challenge. Conventional logic gates, such as AND, OR, and NOT, are prone to data loss during ...
A new technical paper titled “Improving Contact Resistance in Top-Gate Carbon Nanotube Transistor through Self-Aligned MoOx ...
Abstract: This work presents the design of a Full-Bridge power module with three parallel 650 V, 150 A GaN dies per switch. A wire bond free planar interconnect structure is used for the module design ...
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