Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

A colleague once asked, “How do I measure a microvolt at test?” High-resolution dc voltage measurements can be complex. At test, time is money, so making fast, accurate measurements poses a constant ...

As digital speeds and device complexity continue to increase, signals under test are getting more complex, and engineers are more challenged to isolate anomalies in their devices. Test tools for such ...

Designs for secure applications such as smart cards and those used in the defense industry require security to ensure sensitive data is inaccessible to outside agents. This used to be a somewhat niche ...

We evaluated the feasibility of high-resolution noninvasive prenatal screening in 51 pregnancies that were representative of the pregnant population receiving care at the recruitment hospital (Tables ...